SCANNING ELECTRON MICROSCOPE (FESEM)

> SE/BSE Imaging
> Elemental analysis
> EBSD
> TKD
> STEM
> Resolution 0.1 nm

X-Ray DIFFRACTOMETER

> Powder XRD
> 2D diffraction
> GIXRD for films
> Residual Stress analysis
> Bulk Texture (For powder and Bulk)

VIBRATING SAMPLE MAGNETOMETER

➢ Hysteresis loops
➢ Magnetization
➢ Coercivity
➢ Temp.: 80 K - 850 K
➢ Field: upto 10 KOe

SCANNING PROBE MICROSCOPE

➢ Surface topography
➢ (2D & 3D)
➢ Contact / non-contact
➢ Multiple modes (AFM, MFM, KPFM, STM)

RAMAN & PL

❑ Raman Spectroscopy
❑ PL Spectroscopy
❑ Raman & PL Mapping (1D/2D)
❑ Temp. range: 80-850 K


ICP-OES

❑ Chemical Analysis
❑ Detection limit:
- < 1 ppm (sample Dependent)
- < 1 ppb (for hydride-generating elements)


 Multiferroic test system

UV-Visible spectroscopy

Particle sizing (Dynamic light Scattering)

Micro-Hardness

Optical microscopy

TGA / DSC